Are there any test points on PCB available to probe UFS signals? Is it a two lane or single lane
There are 2-lanes per direction on the schematics but the UFS package (KLUBG4G1CE-B0B1) supports only one-lane according to samsung: http://www.samsung.com/semiconductor/estorage/eufs/KLUBG4G1CE-B0B1/. So I assume only lanes RX0/TX0 are used at the end.
There is no test-points directly on the communication lanes but there is four test points (TP1601, TP1602, TP1603, TP1604) directly connected to the UFS package pins (E9, E10, F10, K10). However I don’t know what kind of signal they are (I do not have UFS datasheet).